scan-testing

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wellitsabhinav / PACT--Physical-and-ATPG-aware-Co-optimization-of-Test-architectures

Research framework for physical- and ATPG-aware scan-architecture co-optimization, with routed validation and documented negative physical-impact results.

asic research dft eda multi-objective-optimization reproducibility vlsi atpg physical-design openroad test-architecture opensta negative-results scan-chain chip-design design-for-test scan-testing fan-atpg

Updated Oct 24, 2026
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